Selecting suitable image dimensions for scanning probe microscopy
نویسندگان
چکیده
منابع مشابه
Scanning hall probe microscopy technique for investigation of magnetic properties
Scanning Hall Probe Microscopy (SHPM) is a scanning probe microscopy technique developed to observe and image magnetic fields locally. This method is based on application of the Hall Effect, supplied by a micro hall probe attached to the end of cantilever as a sensor. SHPM provides direct quantitative information on the magnetic state of a material and can also image magnetic induction under a...
متن کاملScanning hall probe microscopy technique for investigation of magnetic properties
Scanning Hall Probe Microscopy (SHPM) is a scanning probe microscopy technique developed to observe and image magnetic fields locally. This method is based on application of the Hall Effect, supplied by a micro hall probe attached to the end of cantilever as a sensor. SHPM provides direct quantitative information on the magnetic state of a material and can also image magnetic induction under a...
متن کاملAdvanced Image Characterization in Scanning Probe Microscopy
This work presents the application of advanced analysis processes and datamining to images produced by scanning probe microscopy in polymers samplers. These techniques are applied to two specific problems: statistical characterization of polydispersivity in films of poly (o-methoxyaniline) (POMA) and morphological analysis of substrates of polymers used to produce liquid crystals alignment.
متن کاملScanning probe image wizard: a toolbox for automated scanning probe microscopy data analysis.
We describe SPIW (scanning probe image wizard), a new image processing toolbox for SPM (scanning probe microscope) images. SPIW can be used to automate many aspects of SPM data analysis, even for images with surface contamination and step edges present. Specialised routines are available for images with atomic or molecular resolution to improve image visualisation and generate statistical data ...
متن کاملAdvances in Crystallographic Image Processing for Scanning Probe Microscopy
This book chapter reviews progress in crystallographic image processing (CIP) for scanning probe microscopy (SPM) that has occurred since our description of the technique was first put into open access in this book series in the year 2010. The signal to noise ratio in all kinds of experimental images of more or less regular 2D periodic arrays is significantly enhanced by CIP and the technique i...
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ژورنال
عنوان ژورنال: Surfaces and Interfaces
سال: 2017
ISSN: 2468-0230
DOI: 10.1016/j.surfin.2017.09.003